Title :
The exponentiated Weibull family: a graphical approach
Author :
Jiang, R. ; Murthy, D.N.P.
Author_Institution :
Changsha Commun. Univ., China
fDate :
3/1/1999 12:00:00 AM
Abstract :
The exponentiated Weibull family extends the two-parameter Weibull distribution. The shape of the Weibull plotting-paper plots are discussed, and a parametric characterization of the pdf and the failure rate for the exponentiated Weibull family are carried out. Such a study is very relevant to deciding if a given data set can be adequately modeled by such a distribution
Keywords :
Weibull distribution; failure analysis; reliability theory; Weibull plotting-paper plots; data sets; exponentiated Weibull family; failure rate; parametric characterization; pdf; reliability; Parameter estimation; Parametric study; Scattering; Shape; Weibull distribution;
Journal_Title :
Reliability, IEEE Transactions on
