DocumentCode :
1510685
Title :
Goodness-of-fit tests for type-I extreme-value and 2-parameter Weibull distributions
Author :
Shimokawa, Toshiyuki ; Liao, Min
Author_Institution :
Nat. Aerosp. Lab., Tokyo, Japan
Volume :
48
Issue :
1
fYear :
1999
fDate :
3/1/1999 12:00:00 AM
Firstpage :
79
Lastpage :
86
Abstract :
This study investigates the properties of the Kolmogorov-Smirnov (K-S), Cramer-von Mises (C-M) and Anderson-Darling (A-D) statistics for goodness-of-fit tests for type-I extreme-value and for 2-parameter Weibull distributions, when the population parameters are estimated from a complete sample by graphical plotting techniques (GPT). Three GPT-median ranks, mean ranks, symmetrical sample cumulative distribution (symmetrical ranks)-are combined with the least-squares method (LSM) on extreme-value and Weibull probability paper to estimate the population parameters. The critical values of the K-S, C-M, A-D statistics are calculated by Monte Carlo simulation, in which 106 sets of samples for each sample size of 3(1)20, 25(5)50, and 60(10)100 are generated. The power of the K-S, C-M, A-D statistics are investigated for 3 graphical plotting techniques and for maximum likelihood estimators (MLE). A Monte Carlo simulation provided the power results using 104 repetitions for each sample size of 5, 10, 25, 40. The power comparison showed that: Among 3 GPT, the symmetrical ranks give more powerful results than the median and mean ranks for the K-S, C-M, A-D statistics; Among 3 GPT and the MLE, the symmetrical ranks provide more powerful results than the MLE for the K-S and A-D statistics; for the C-M statistic, the MLE provide more powerful results than 3 GPT; Generally, the A-D statistic coupled with the symmetrical ranks and LSM is most powerful among the competitors in this study and is recommended for practical use
Keywords :
Monte Carlo methods; Weibull distribution; failure analysis; reliability theory; Anderson-Darling statistics; Cramer-von Mises statistics; Kolmogorov-Smirnov statistics; Monte Carlo simulation; Weibull distributions; goodness-of-fit tests; graphical plotting techniques; least-squares method; population parameters; reliability analysis; symmetrical ranks; Aerospace testing; Laboratories; Maximum likelihood estimation; Monte Carlo methods; Parameter estimation; Probability; Statistical analysis; Statistical distributions; Statistics; Weibull distribution;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.765931
Filename :
765931
Link To Document :
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