Title :
I&M Society technical committees: an overview
Author_Institution :
Technical and standards activities
fDate :
6/1/1999 12:00:00 AM
Keywords :
Computer aided manufacturing; Electromagnetic measurements; Frequency; Instrumentation and Measurement Society; Instruments; Internet; NIST; Noise measurement; Standards development; Testing;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.1999.765963