Title :
New trends in intelligent system design for embedded and measurement applications
Author :
Alippi, Cesare ; Ferrari, Stefano ; Piuri, Vincennzo ; Sami, Mariagiovanna ; Scotti, Fabio
Author_Institution :
Politecnico di Milano, Italy
fDate :
6/1/1999 12:00:00 AM
Abstract :
Intelligent systems adopt soft-computing techniques (encompassing neural networks, fuzzy logic, genetic algorithms, and expert systems) to solve complex problems by mimicking human reasoning. On the other hand, conventional algorithmic approaches are extremely powerful and efficient in tackling applications for which a procedural solution can be easily defined. By themselves, each of these techniques may be the optimal solution for a subproblem, but not efficient enough to solve the problem as a whole. Composite systems, consisting of conventional and soft-computing components in cooperation, are now more than a promise to face complex application needs. In this article we present recent advances in the design of composite systems, with specific reference to embedded and measurement applications
Keywords :
embedded systems; expert systems; finite state machines; formal specification; fuzzy logic; genetic algorithms; hardware-software codesign; large-scale systems; measurement systems; neural nets; object-oriented methods; sensor fusion; virtual instrumentation; CAD environment; co-design techniques; complex problems; composite systems; embedded applications; expert systems; formal specification; functional specification; fuzzy logic; genetic algorithms; hardware/software architecture; integrated design methodology; intelligent system design; measurement applications; mimicking human reasoning; neural networks; object oriented description; partitioning; sensor fusion; soft-computing techniques; specification language; state diagram; Embedded system; Instruments; Intelligent systems; Interconnected systems; Phase measurement; Sensor fusion; Sensor phenomena and characterization; Sensor systems; Sensor systems and applications; Signal processing;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/5289.765968