DocumentCode :
1511095
Title :
Commentary: inference in simple step-stress models
Author :
Watkins, Alan J.
Author_Institution :
EBMS, Univ. Coll. of Swansea, UK
Volume :
50
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
36
Lastpage :
37
Abstract :
This note considers simple step-stress models with type-II censored exponential data. For two stress-levels and a log-linear link between stress and mean life, there is a reparameterization of the parameters of the negative exponential distributions, so that one can equally well work with these parameters or those in the log-linear link. From a statistical perspective, it is preferable to work with the parameters of the negative exponential distributions, since the "lack-of-memory" property of this distribution allows the analysis to be sub-divided, with ensuing simplification.
Keywords :
exponential distribution; inference mechanisms; life testing; accelerated life testing; exponential distribution; lack-of-memory; log-linear link; mean life; negative exponential distributions; simple step-stress models inference; statistical perspective; type-II censored exponential data; Algebra; Computer aided software engineering; Exponential distribution; Lead; Life testing; Probability density function; Stress;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.935014
Filename :
935014
Link To Document :
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