DocumentCode :
1511325
Title :
Investigation of Abnormal 
Shifts Under Operating Conditions in Flash Memory Cells With 
$hbox{Al}_{2}hbox{O}_{3}$ ; Flash memory; charge trapping (CT); electron trap; floating gate (FG); high-$kappa$
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2194294
Filename :
6196218
Link To Document :
