DocumentCode :
1511350
Title :
Interleaved Four-Phase Buck-Based Current Source With Center-Tapped Energy-Recovery Scheme for Electrical Discharge Machining
Author :
Lin, Ray-Lee ; Hsu, Cheng-Ching ; Changchien, Shih-Kuen
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
26
Issue :
1
fYear :
2011
Firstpage :
110
Lastpage :
118
Abstract :
This paper proposes a center-tapped energy-recovery scheme used in the interleaved four-phase buck-based current source in continuous-conduction mode for electrical discharge machining (EDM). A pulse-machining current with high-slew rate is required for the EDM. Using the interleaving technique, the output-current slew rate of the buck-based current source can be improved because of the paralleled inductors at the start of discharge. The proposed center-tapped energy-recovery scheme provides a major path for the inductor to release its stored energy to avoid high-voltage stress in the output terminal when the gap is in the high-impedance state. The energy stored in the inductor is recovered to the input capacitor, and can be reused for machining. The experimental results are provided as the verification of the high-output-current slew rate and the energy recovery when the gap is in high-impedance state.
Keywords :
capacitor storage; constant current sources; discharges (electric); electrical discharge machining; inductors; EDM; capacitor; center-tapped energy-recovery scheme; continuous-conduction mode; discharge; electrical discharge machining; energy storage; high-impedance state; high-slew rate; interleaved four-phase buck-based current source; parallel inductor; pulse-machining current; Conducting materials; Dielectric materials; Electrodes; Fault location; Inductors; Machining; Power supplies; Resonance; Sparks; Voltage; Center-tapped; current source; discharge machining; energy recovery; interleaved, multi-phase;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2010.2052070
Filename :
5482123
Link To Document :
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