Title :
Residue Number System Arithmetic-Inspired Hopping-Pilot Pattern Design
Author :
Zhu, Dalin ; Natarajan, Balasubramaniam
Author_Institution :
Dept. of Wireless Commun., NEC Labs. China (NLC), Beijing, China
Abstract :
In this paper, we propose a novel application of residue number system (RNS) arithmetic in designing hopping-pilot patterns for cellular downlink orthogonal frequency-division multiple access (OFDMA). By hopping the scan lines in either the time or the frequency domain, RNS-based pilot patterns fulfill the Nyquist sampling theorem. That is, by using RNS-based pilot patterns, the channel´s delay-Doppler response can fully be reconstructed without severe aliasing. In addition to channel estimation, our proposed scheme can achieve other objectives, such as device/cell identification and time-frequency synchronization. We show that the RNS-based approach has more pairs of hopping-pilot patterns that are collision free than the Costas-array-based method. This is helpful in not only mitigating intra-/intercell interference but also identifying multiple devices in a multicell multiantenna environment. Moreover, hopping in time increases the pilot´s time support, which, in turn, enables quick initial acquisition of time-frequency offsets.
Keywords :
Nyquist criterion; OFDM modulation; antenna arrays; channel estimation; frequency-domain analysis; interference (signal); synchronisation; time-domain analysis; Costas array; Doppler response; Nyquist sampling theorem; OFDMA; cellular downlink; channel delay; channel estimation; frequency domain; hopping-pilot pattern design; intercell interference; intracell interference; multicell multiantenna; orthogonal frequency division multiple access; residue number system arithmetic; time domain; time-frequency synchronization; Arithmetic; Channel estimation; Collision mitigation; Delay; Downlink; Frequency domain analysis; Frequency synchronization; Interference; Sampling methods; Time frequency analysis; Downlink orthogonal frequency-division multiple access (OFDMA); hopping-pilot pattern; intra-cell interference; residue number system arithmetic;
Journal_Title :
Vehicular Technology, IEEE Transactions on
DOI :
10.1109/TVT.2010.2051692