DocumentCode :
1512062
Title :
Magnetic resonance force microscopy with a permanent magnet on the cantilever
Author :
Zhang, Z. ; Hammel, P.C.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
Volume :
33
Issue :
5
fYear :
1997
fDate :
9/1/1997 12:00:00 AM
Firstpage :
4047
Lastpage :
4049
Abstract :
When the variation of the bias field is on the order of a few hundred gauss, permanent magnetic microparticles of Nd2Fe14B (NdFeB) mounted on atomic force microscopy (AFM) cantilevers generate much smaller nonresonance (NR) signals in the magnetic resonance force microscopy (MRFM) spectra than most soft magnetic thin films. However, the interactions of the NdFeB particle with the bias field cause an undesirable variation of the cantilever resonance frequency with changing bias field. Our model indicates the importance of minimizing the polarized moment of the magnetic tip and ensuring that the applied fields employed in the MRFM experiment be highly uniform
Keywords :
magnetic force microscopy; magnetic resonance; permanent magnets; AFM cantilever; Nd2Fe14B; magnetic resonance force microscopy; permanent magnetic microparticles; Atomic force microscopy; Gaussian processes; Iron; Magnetic films; Magnetic force microscopy; Magnetic resonance; Micromagnetics; Neodymium; Permanent magnets; Signal generators;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.619658
Filename :
619658
Link To Document :
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