DocumentCode :
1512101
Title :
Characterisation of MFM tip fields by electron tomography
Author :
Ferrier, R.P. ; McVitie, S. ; Gallagher, A. ; Nicholson, W.A.P.
Author_Institution :
Dept. of Phys. & Astron., Glasgow Univ., UK
Volume :
33
Issue :
5
fYear :
1997
fDate :
9/1/1997 12:00:00 AM
Firstpage :
4062
Lastpage :
4064
Abstract :
Lorentz electron microscopy has been applied to the study of the magnetic field distribution from MFM tips. Data acquired by this technique has been used to reconstruct the field distribution from the MFM tip by tomography. Initial results have been obtained from commercial tips which have been magnetised along the tip axis. The reconstructed field is consistent with the predicted form
Keywords :
electron microscopy; magnetic field measurement; magnetic force microscopy; tomography; Lorentz electron microscopy; MFM tip; electron tomography; magnetic field distribution; Assembly; Electrons; Image reconstruction; Instruments; Magnetic force microscopy; Magnetostatics; Optical films; Optical imaging; Optical microscopy; Tomography;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.619663
Filename :
619663
Link To Document :
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