Title :
Self-assembled InAs-GaAs quantum-dot intersubband detectors
Author :
Phillips, J. ; Bhattacharya, Pallab ; Kennerly, S.W. ; Beekman, D.W. ; Dutta, M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
The use of self-assembled InAs-GaAs quantum dots in photoconductive intersubband detectors in the far-infrared is presented. Far-infrared absorption is observed in self-assembled quantum dots in the 6-18-μm range for subband-subband and subband-continuum transitions. Photoconductive quantum-dot intersubband detectors were fabricated and demonstrate tunable operating wavelengths between 6-18 μm using subband-subband or subband-continuum transitions. The use of AlAs barriers allows further tuning to shorter wavelengths of 3-7 μm. Subband-continuum quantum dot intersubband detectors show encouraging normal incidence performance characteristics at T=40 K, with responsivities of 10-100 mA/W, detectivities of 1-10 ×109 cm·Hz1/2/W and large photoconductive gain up to g=12 for a ten-layer quantum-dot heterostructure. With improvements in device structure, self-assembled quantum dots can be expected to provide intrinsic normal incidence broad-band detectors with advantages over quantum wells
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; infrared detectors; photoconducting devices; semiconductor quantum dots; 40 K; 6 to 18 mum; AlAs barriers; InAs-GaAs; intrinsic normal incidence broad-band detectors; large photoconductive gain; normal incidence performance characteristics; photoconductive intersubband detectors; photoconductive quantum-dot intersubband detectors; self-assembled InAs-GaAs quantum-dot intersubband detectors; self-assembled quantum dots; subband-continuum transitions; subband-subband transitions; Absorption; Detectors; Epitaxial growth; Laser sintering; Optical materials; Performance gain; Photoconductivity; Photonic band gap; Quantum dots; Semiconductor materials;
Journal_Title :
Quantum Electronics, IEEE Journal of