• DocumentCode
    151246
  • Title

    Novel IGBT module design, material and reliability technology for 175°C continuous operation

  • Author

    Saito, Takashi ; Nishimura, Yasutaro ; Momose, Fumihiko ; Morozumi, Akira ; Tamai, Yuta ; Mochizuki, Eiji ; Takahashi, Y.

  • Author_Institution
    Dept. of Package Dev., Fuji Electr. Co., Ltd., Fuji, Japan
  • fYear
    2014
  • fDate
    14-18 Sept. 2014
  • Firstpage
    4367
  • Lastpage
    4372
  • Abstract
    One solution for increasing output power in general purpose inverters is raising the operation temperature of Insulated Gate Bipolar Transistor (IGBT) modules by junction max temperature (Tjmax) =175°C against conventional Tjmax=150°C. However, the main problem for Tjmax=175°C operation is decreased the power cycling (P/C) capability caused by higher temperature. In this paper, we investigated the failure mechanisms of P/C test at Tjmax=175°C. From these detailed investigations, the failure modes of IGBT module are dominated by three joint parts under three categorized temperature regions. By using these results, we have developed three new technologies to achieve higher P/C capability: (a) New Al alloy bonding wire with higher fatigue capability, (b) High strength solder at high temperature, (c) New die electrode metallization with higher strength under high temperature and lower thermal stress between Si die and Al wire. With these technologies, our new IGBT module has the excellent P/C capability of continuous operation at Tjmax=175°C and longer lifetime compared with the conventional one.
  • Keywords
    bonding processes; electrochemical electrodes; failure analysis; fatigue; insulated gate bipolar transistors; invertors; junction gate field effect transistors; modules; semiconductor device metallisation; semiconductor device reliability; soldering; thermal stresses; Al alloy bonding wire; IGBT module design; P-C test capability; die electrode metallization; failure mechanism; fatigue capability; high strength solder; insulated gate bipolar transistor module; inverter; power cycling capability; reliability; temperature 150 degC; temperature 175 degC; thermal stress; Aging; Insulated gate bipolar transistors; Materials; Metallization; Tin; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2014 IEEE
  • Conference_Location
    Pittsburgh, PA
  • Type

    conf

  • DOI
    10.1109/ECCE.2014.6953996
  • Filename
    6953996