DocumentCode :
151246
Title :
Novel IGBT module design, material and reliability technology for 175°C continuous operation
Author :
Saito, Takashi ; Nishimura, Yasutaro ; Momose, Fumihiko ; Morozumi, Akira ; Tamai, Yuta ; Mochizuki, Eiji ; Takahashi, Y.
Author_Institution :
Dept. of Package Dev., Fuji Electr. Co., Ltd., Fuji, Japan
fYear :
2014
fDate :
14-18 Sept. 2014
Firstpage :
4367
Lastpage :
4372
Abstract :
One solution for increasing output power in general purpose inverters is raising the operation temperature of Insulated Gate Bipolar Transistor (IGBT) modules by junction max temperature (Tjmax) =175°C against conventional Tjmax=150°C. However, the main problem for Tjmax=175°C operation is decreased the power cycling (P/C) capability caused by higher temperature. In this paper, we investigated the failure mechanisms of P/C test at Tjmax=175°C. From these detailed investigations, the failure modes of IGBT module are dominated by three joint parts under three categorized temperature regions. By using these results, we have developed three new technologies to achieve higher P/C capability: (a) New Al alloy bonding wire with higher fatigue capability, (b) High strength solder at high temperature, (c) New die electrode metallization with higher strength under high temperature and lower thermal stress between Si die and Al wire. With these technologies, our new IGBT module has the excellent P/C capability of continuous operation at Tjmax=175°C and longer lifetime compared with the conventional one.
Keywords :
bonding processes; electrochemical electrodes; failure analysis; fatigue; insulated gate bipolar transistors; invertors; junction gate field effect transistors; modules; semiconductor device metallisation; semiconductor device reliability; soldering; thermal stresses; Al alloy bonding wire; IGBT module design; P-C test capability; die electrode metallization; failure mechanism; fatigue capability; high strength solder; insulated gate bipolar transistor module; inverter; power cycling capability; reliability; temperature 150 degC; temperature 175 degC; thermal stress; Aging; Insulated gate bipolar transistors; Materials; Metallization; Tin; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2014 IEEE
Conference_Location :
Pittsburgh, PA
Type :
conf
DOI :
10.1109/ECCE.2014.6953996
Filename :
6953996
Link To Document :
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