Title :
A high temperature silicon carbide MOSFET power module with integrated silicon-on-insulator based gate drive
Author :
Zhiqiang Wang ; Xiaojie Shi ; Tolbert, Leon M. ; Wang, Fred ; Zhenxian Liang ; Costinett, Daniel ; Blalock, Benjamin J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
Abstract :
This paper presents a board-level integrated silicon carbide (SiC) MOSFET power module for high temperature and high power density applications. Specifically, a silicon-on-insulator (SOI) based gate driver capable of operating at 200°C ambient temperature is designed and fabricated. The sourcing and sinking current capability of the gate driver are tested under various ambient temperatures. Also, a 1200 V/100 A SiC MOSFET phase-leg power module is developed utilizing high temperature packaging technologies. The static characteristics, switching performance, and short-circuit behavior of the fabricated power module are fully evaluated at different temperatures. Moreover, a buck converter prototype composed of the SOI gate driver and SiC power module is built for high temperature continuous operation. The converter is operated at different switching frequencies up to 100 kHz, with its junction temperature monitored by a thermo-sensitive electrical parameter (TSEP) and compared with thermal simulation results. The experimental results from the continuous operation demonstrate the high temperature capability of the power module at a junction temperature greater than 225°C.
Keywords :
MOSFET circuits; driver circuits; power MOSFET; semiconductor device packaging; silicon compounds; silicon-on-insulator; wide band gap semiconductors; MOSFET phase-leg power module; SOI; SiC; TSEP; board-level integrated silicon carbide MOSFET power module; buck converter prototype; current 100 A; high power density; high temperature continuous operation; high temperature packaging technology; high temperature silicon carbide MOSFET power module; integrated silicon-on-insulator based gate drive; junction temperature; short-circuit behavior; static characteristics; switching performance; temperature 200 degC; thermal simulation; thermo-sensitive electrical parameter; voltage 1200 V; Logic gates; MOSFET; Multichip modules; Silicon carbide; Switches; Temperature; Temperature measurement;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2014 IEEE
Conference_Location :
Pittsburgh, PA
DOI :
10.1109/ECCE.2014.6953997