Title :
On the Co-Polarized Phase Difference of Rough Layered Surfaces: Formulae Derived From the Small Perturbation Method
Author :
Afifi, Saddek ; Dusséaux, Richard
Author_Institution :
Lab. de Phys. des Lasers et de Spectroscopie Opt. et d´´Opto-Electron. (LAPLASO), Univ. Badji Mokhtar Annaba, Annaba, Algeria
fDate :
7/1/2011 12:00:00 AM
Abstract :
We determine the statistical distribution of the co-polarized phase difference of fields scattered from a stack of two two-dimensional rough interfaces in the incidence plane. The electromagnetic fields are represented by Rayleigh expansions and a perturbation method is used to solve the boundary value problem and to determine the first-order scattering amplitudes. For slightly rough interfaces with infinite length and Gaussian height distributions, we show that the probability density function is only a function of two parameters. For a sand layer on a granite surface in backscattering configurations, we study the influence of the incidence angle, the layer thickness, the cross-spectral density and the wave frequency upon both parameters of the probability law.
Keywords :
Gaussian distribution; boundary-value problems; electromagnetic fields; electromagnetic wave scattering; perturbation theory; Gaussian height distributions; Rayleigh expansions; backscattering configurations; boundary value problem; copolarized phase difference; cross-spectral density; electromagnetic fields; electromagnetic wave scattering; first-order scattering amplitudes; granite surface; incidence plane; infinite length; layer thickness; probability density function; rough layered surfaces; small perturbation method; statistical distribution; two-dimensional rough interfaces; wave frequency; Covariance matrix; Optical surface waves; Perturbation methods; Probability density function; Rough surfaces; Scattering; Surface roughness; Co-polarized phase difference; density probability function; random surfaces; scattering amplitudes; small perturbation method;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2011.2152347