DocumentCode :
1512667
Title :
A new common-emitter hybrid-π small-signal equivalent circuit for bipolar transistors with significant neutral base recombination
Author :
Niu, Guofu ; Cressler, John D. ; Gogineni, Usha ; Joseph, Alvin J.
Author_Institution :
Dept. of Electr. Eng., Auburn Univ., AL, USA
Volume :
46
Issue :
6
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
1166
Lastpage :
1173
Abstract :
The linear superposition approach to the modeling of small-signal parameters in the presence of substantial base recombination, which involves a virtual transistor without base recombination, is identified to cause incorrect emitter current modeling. All of the terminal current changes can be correctly modeled by using the measured forced-VBE Early voltage in a new equivalent circuit, which properly accounts for NBR and Early effect in a physically consistent manner. As a result, practical situations of small collector-base resistance (τ μ) can be properly handled, τμ is related to the ac current-drive and ac voltage-drive Early voltages, which facilitates parameter extraction and circuit modeling. Measurements on state-of-the-art UHV/CVD SiGe HBT´s show that the conventional assumption that τμ is far larger than the forced-VBE output resistance τ0 does not apply to devices with significant NBR. In practice, τμ can be comparable to (and smaller than) τ0 depending on the device processing, profiles and operating temperature. Temperature dependent data are presented, and circuit implications are discussed based on the new equivalent circuit
Keywords :
Ge-Si alloys; electron-hole recombination; equivalent circuits; heterojunction bipolar transistors; semiconductor device models; semiconductor materials; Early voltage; SiGe; UHV/CVD SiGe HBT; bipolar transistor; collector-base resistance; common-emitter hybrid-π small-signal equivalent circuit; emitter current model; linear superposition; neutral base recombination; parameter extraction; virtual transistor; Bipolar transistors; Current measurement; Electrical resistance measurement; Equivalent circuits; Force measurement; Germanium silicon alloys; Microelectronics; Silicon germanium; Temperature dependence; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.766879
Filename :
766879
Link To Document :
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