• DocumentCode
    1512667
  • Title

    A new common-emitter hybrid-π small-signal equivalent circuit for bipolar transistors with significant neutral base recombination

  • Author

    Niu, Guofu ; Cressler, John D. ; Gogineni, Usha ; Joseph, Alvin J.

  • Author_Institution
    Dept. of Electr. Eng., Auburn Univ., AL, USA
  • Volume
    46
  • Issue
    6
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    1166
  • Lastpage
    1173
  • Abstract
    The linear superposition approach to the modeling of small-signal parameters in the presence of substantial base recombination, which involves a virtual transistor without base recombination, is identified to cause incorrect emitter current modeling. All of the terminal current changes can be correctly modeled by using the measured forced-VBE Early voltage in a new equivalent circuit, which properly accounts for NBR and Early effect in a physically consistent manner. As a result, practical situations of small collector-base resistance (τ μ) can be properly handled, τμ is related to the ac current-drive and ac voltage-drive Early voltages, which facilitates parameter extraction and circuit modeling. Measurements on state-of-the-art UHV/CVD SiGe HBT´s show that the conventional assumption that τμ is far larger than the forced-VBE output resistance τ0 does not apply to devices with significant NBR. In practice, τμ can be comparable to (and smaller than) τ0 depending on the device processing, profiles and operating temperature. Temperature dependent data are presented, and circuit implications are discussed based on the new equivalent circuit
  • Keywords
    Ge-Si alloys; electron-hole recombination; equivalent circuits; heterojunction bipolar transistors; semiconductor device models; semiconductor materials; Early voltage; SiGe; UHV/CVD SiGe HBT; bipolar transistor; collector-base resistance; common-emitter hybrid-π small-signal equivalent circuit; emitter current model; linear superposition; neutral base recombination; parameter extraction; virtual transistor; Bipolar transistors; Current measurement; Electrical resistance measurement; Equivalent circuits; Force measurement; Germanium silicon alloys; Microelectronics; Silicon germanium; Temperature dependence; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.766879
  • Filename
    766879