DocumentCode :
1513270
Title :
Regime analysis of rainfall drop-size distribution models for microwave terrestrial networks
Author :
Alonge, Akintunde A. ; Afullo, Thomas J.
Author_Institution :
Sch. of Electr., Electron. & Comput. Eng., Univ. of KwaZulu-Natal, Durban, South Africa
Volume :
6
Issue :
4
fYear :
2012
Firstpage :
393
Lastpage :
403
Abstract :
In this study, parameters of statistical models for estimating the rainfall specific attenuation in Durban, South Africa are derived. The rainfall data in this work are based on 2-year measurements obtained via the Joss-Waldvogel RD-80 disdrometer between January 2009 and December 2010. Four rainfall regimes are applied: drizzle, widespread, shower and thunderstorm types. Using the third, fourth and sixth moments of the measured data, estimators for four rainfall drop-size distribution (DSD) models - 3-parameter lognormal model, negative exponential model, 3-parameter Weibull model and the modified gamma model - are computed. The specific attenuation estimates from our model are compared with the values from predicted measurements alongside the International Telecommunication Union (ITU) estimates for frequencies between 2 and 100-GHz. The results from the specific attenuation estimation are compared with the semi-empirical measurements for their respective regimes using root-mean-square and X2 error tests. From the results, the best models for the various regimes are: Weibull model for drizzle regime, modified gamma model for widespread and shower regimes and lognormal model for the thunderstorm regime.
Keywords :
Mie scattering; Weibull distribution; microwave measurement; rain; 3-parameter Weibull model; 3-parameter lognormal model; disdrometer; drizzle regime; microwave terrestrial networks; modified gamma model; negative exponential model; rainfall data; rainfall drop-size distribution models; regime analysis; specific attenuation estimation; statistical models; thunderstorm regime;
fLanguage :
English
Journal_Title :
Microwaves, Antennas & Propagation, IET
Publisher :
iet
ISSN :
1751-8725
Type :
jour
DOI :
10.1049/iet-map.2011.0411
Filename :
6197320
Link To Document :
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