Title :
A silicon carbide fault current limiter for distribution systems
Author :
Yusi Liu ; Farnell, Chris ; Hao Zhang ; Escobar-Mejia, Andres ; Mantooth, Homer Alan ; Balda, Juan Carlos ; Ang, Simon S.
Author_Institution :
Dept. of Electr. Eng., Univ. of Arkansas, Fayetteville, AR, USA
Abstract :
Increasing load densities are leading to higher fault currents that may exceed the ratings of current circuit breakers. In addition, computer-controlled equipment is more susceptible to power supply disturbances of relatively long durations. So, there is a need for a new piece of equipment which is able to interrupt fault currents before reaching their first maximum peak isolating very fast faulted sections of a distribution system. Solid-state fault current limiters (SSFCL) have been proposed as a solution to accomplish the above, and thus, as a substitute for slow-operating electromechanical circuit breakers. The design of a silicon carbide fault current limiter with high voltage blocking capability and the subsequent testing at a 15-kV test facility are addressed in this paper. The semiconductor devices of this series-connected SSFCL are custom packaged silicon carbide super gate turnoff thyristors and SiC PIN diodes. The 4.16-kV experimental tests illustrate the performance of the proposed SSFCL and demonstrate the potential for deploying them in distribution systems.
Keywords :
circuit breakers; distribution networks; fault current limiters; p-i-n diodes; silicon compounds; thyristors; wide band gap semiconductors; PIN diodes; SiC; computer-controlled equipment; distribution systems; electromechanical circuit breakers; power supply disturbances; semiconductor devices; solid-state fault current limiters; thyristors; voltage 15 kV; voltage 4.16 kV; Circuit faults; Fault current limiters; Fault currents; Logic gates; Phase control; Power systems; Silicon carbide; silicon carbide; solid-state fault current limiter; super gate turnoff thyristor;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2014 IEEE
Conference_Location :
Pittsburgh, PA
DOI :
10.1109/ECCE.2014.6954083