Title :
Testing schemes for FIR filter structures
Author :
Mukherjee, Nilanjan ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
fDate :
7/1/2001 12:00:00 AM
Abstract :
This paper presents a new pseudoexhaustive test methodology for digital finite impulse response (FIR) filters. The proposed scheme can be employed to detect any combinational faults within the basic cell of the functional units occurring in linear phase comb filters, trees of sign-extended adders and phase-shift multipliers. It uses additive generators as a source of pseudoexhaustive patterns to systematically test all FIR filter building blocks
Keywords :
FIR filters; combinational circuits; digital filters; logic testing; transient response; FIR filter structures; additive generators; combinational faults; digital finite impulse response filters; functional units; linear phase comb filters; phase-shift multipliers; pseudoexhaustive patterns; pseudoexhaustive test methodology; sign-extended adders; testing schemes; trees; Adders; Automatic testing; Built-in self-test; Circuit testing; Digital filters; Digital signal processing; Fault detection; Finite impulse response filter; Hardware; Impulse testing;
Journal_Title :
Computers, IEEE Transactions on
