DocumentCode :
1513421
Title :
An hypothesis test technique for determining a difference in sampled parts defective utilizing Fisher´s exact test IC production
Author :
Hackerott, Michael ; Urquhart, Andy
Author_Institution :
Motorola Inc., Austin, TX, USA
Volume :
3
Issue :
4
fYear :
1990
fDate :
11/1/1990 12:00:00 AM
Firstpage :
247
Lastpage :
248
Abstract :
The result of sample testing during the production of integrated circuits is often a very small number of parts defective out of a sample which is itself very small compared to its population. The ability to determine a statistically significant difference when comparing the results of two such samples is critical in correctly evaluating the outcome of experiments. Fisher´s exact test can be used in this situation because it is a method for testing the difference between two proportions of parts defective when the proportions are relatively small in comparison to the sample size. The results of the test are very accurate when the populations are at least ten times the sample size. The result of the test is independent of the order of the samples. However, because the test is one-sided, care must be taken to state the alternative hypothesis based upon the order of the magnitudes of the sample fractions defective
Keywords :
integrated circuit manufacture; statistical analysis; Fisher´s exact test; IC production; hypothesis test technique; integrated circuits; statistically significant difference; Circuit testing; Integrated circuit testing; Manufacturing processes; Performance evaluation; Postal services; Production; Statistical analysis;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.61974
Filename :
61974
Link To Document :
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