• DocumentCode
    1513721
  • Title

    Pi-Gate SOI MOSFET

  • Author

    Park, Jong-Tae ; Colinge, Jean-Pierre ; Diaz, Carlos H.

  • Author_Institution
    Taiwan Semicond. Manuf. Corp., Hsinchu, Taiwan
  • Volume
    22
  • Issue
    8
  • fYear
    2001
  • Firstpage
    405
  • Lastpage
    406
  • Abstract
    This paper describes computer simulations of various SOI MOSFETs with double and triple gate structures, as well as gate-all-around devices. The concept of a triple-gate device with sidewalls extending into the buried oxide (hereby called a "/spl Pi/-gate" or "Pi-gate" MOSFET) is introduced, The proposed device is simple to manufacture and offers electrical characteristics similar to the much harder to fabricate gate-all-around MOSFET.
  • Keywords
    MOSFET; buried layers; semiconductor device models; silicon-on-insulator; /spl Pi/-gate MOSFET; Pi-Gate SOI MOSFET; buried oxide; computer simulations; double gate structure; electrical characteristics; gate-all-around devices; subthreshold characteristics; triple gate structure; CMOS process; Computer simulation; Electric variables; FETs; MOS devices; MOSFET circuits; Manufacturing processes; Semiconductor device manufacture; Silicon on insulator technology; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.936358
  • Filename
    936358