Title :
Passive Polarimetric Imagery-Based Material Classification Robust to Illumination Source Position and Viewpoint
Author :
Krishna, Thilakam Vimal Thilak ; Creusere, Charles D. ; Voelz, David G.
Author_Institution :
NVIDIA Corp., Santa Clara, CA, USA
Abstract :
Polarization, a property of light that conveys information about the transverse electric field orientation, complements other attributes of electromagnetic radiation such as intensity and frequency. Using multiple passive polarimetric images, we develop an iterative, model-based approach to estimate the complex index of refraction and apply it to target classification.
Keywords :
electromagnetic wave polarisation; electromagnetic waves; electromagnetic radiation; illumination source position; passive polarimetric imagery-based material classification; polarization; target classification; transverse electric field orientation; Index of refraction estimation; pBRDF modeling; polarimetric imaging;
Journal_Title :
Image Processing, IEEE Transactions on
DOI :
10.1109/TIP.2010.2052274