Title :
Determining the Impact of Within-Die Variation on Circuit Timing
Author :
Bashir, Muhammad Muqarrab ; Milor, Linda
Author_Institution :
Dept. of Electron. & Commun. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper aims to develop a method to determine the impact of within-die variation in transistors on circuit timing, separately from die-to-die variation. To do this, we find a set of corners that detect all critical paths due to within-die variation. Hence, a finite number of simulations is used to explore the impact within-die variation.
Keywords :
circuit simulation; transistor circuits; circuit simulation; circuit timing; critical path detection; die-to-die variation; transistors within-die variation; Adders; Arrays; Delay; Principal component analysis; Systematics; Threshold voltage; Transistors; Statistical static timing analysis; timing analysis; variation;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2011.2152865
