DocumentCode
1513901
Title
Determining the Impact of Within-Die Variation on Circuit Timing
Author
Bashir, Muhammad Muqarrab ; Milor, Linda
Author_Institution
Dept. of Electron. & Commun. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
24
Issue
3
fYear
2011
Firstpage
385
Lastpage
391
Abstract
This paper aims to develop a method to determine the impact of within-die variation in transistors on circuit timing, separately from die-to-die variation. To do this, we find a set of corners that detect all critical paths due to within-die variation. Hence, a finite number of simulations is used to explore the impact within-die variation.
Keywords
circuit simulation; transistor circuits; circuit simulation; circuit timing; critical path detection; die-to-die variation; transistors within-die variation; Adders; Arrays; Delay; Principal component analysis; Systematics; Threshold voltage; Transistors; Statistical static timing analysis; timing analysis; variation;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/TSM.2011.2152865
Filename
5765704
Link To Document