DocumentCode
1514243
Title
Low-frequency noise in polymer transistors
Author
Deen, M.J. ; Marinov, Oginan ; Holdcroft, S. ; Woods, Walt
Author_Institution
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont.
Volume
48
Issue
8
fYear
2001
fDate
8/1/2001 12:00:00 AM
Firstpage
1688
Lastpage
1695
Abstract
The low-frequency noise (LFN) properties of field-effect transistors (FETs) using polymers as the semiconducting substrate material are investigated and explained in terms of the nonstationary mobility μ in the semiconducting polymer. In the frequency (f) range f<1 kHz it was found that 1/f noise prevails over other types of LFN in these polymer FETs (PFETs). The spectral density SI of LFN of the drain current ID is proportional to the DC power VDS·ID applied to the PFETs channel, from the ohmic to the saturation modes of device operation. In addition, S I is affected by the carrier mobility μ in PFETs channel, as μ in organic FETs is dependent on the biasing. Thus, SI can have an additional sensitivity to ID, that is, SI∝(VDS·ID)1-k, where k~0.1. In general, the 1/f LFN of PFETs follows the relations that have been obtained for crystal and inorganic FETs with minor correction for nonstationary mobility μ
Keywords
1/f noise; carrier mobility; low-power electronics; organic semiconductors; semiconductor device models; semiconductor device noise; thin film transistors; 1/f noise; DC power; PFETs; carrier mobility; drain current; low-frequency noise properties; nonstationary mobility; polymer FETs; polymer semiconducting substrate material; saturation modes; spectral densit; Circuit noise; FETs; Low-frequency noise; OFETs; Optical noise; Optical polymers; Polymer films; Semiconductivity; Semiconductor device noise; Thin film transistors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.936690
Filename
936690
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