Title :
Low-frequency noise in polymer transistors
Author :
Deen, M.J. ; Marinov, Oginan ; Holdcroft, S. ; Woods, Walt
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont.
fDate :
8/1/2001 12:00:00 AM
Abstract :
The low-frequency noise (LFN) properties of field-effect transistors (FETs) using polymers as the semiconducting substrate material are investigated and explained in terms of the nonstationary mobility μ in the semiconducting polymer. In the frequency (f) range f<1 kHz it was found that 1/f noise prevails over other types of LFN in these polymer FETs (PFETs). The spectral density SI of LFN of the drain current ID is proportional to the DC power VDS·ID applied to the PFETs channel, from the ohmic to the saturation modes of device operation. In addition, S I is affected by the carrier mobility μ in PFETs channel, as μ in organic FETs is dependent on the biasing. Thus, SI can have an additional sensitivity to ID, that is, SI∝(VDS·ID)1-k, where k~0.1. In general, the 1/f LFN of PFETs follows the relations that have been obtained for crystal and inorganic FETs with minor correction for nonstationary mobility μ
Keywords :
1/f noise; carrier mobility; low-power electronics; organic semiconductors; semiconductor device models; semiconductor device noise; thin film transistors; 1/f noise; DC power; PFETs; carrier mobility; drain current; low-frequency noise properties; nonstationary mobility; polymer FETs; polymer semiconducting substrate material; saturation modes; spectral densit; Circuit noise; FETs; Low-frequency noise; OFETs; Optical noise; Optical polymers; Polymer films; Semiconductivity; Semiconductor device noise; Thin film transistors;
Journal_Title :
Electron Devices, IEEE Transactions on