• DocumentCode
    1514739
  • Title

    Discard wide-baseline mismatch using contour fragments

  • Author

    Tao, C. ; Tan, Y.-H. ; Wang, Y.T. ; Tian, J.-W.

  • Author_Institution
    State Key Lab. for Multi-spectral Inf. Process. Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • Volume
    46
  • Issue
    12
  • fYear
    2010
  • Firstpage
    834
  • Lastpage
    835
  • Abstract
    A method to discard wide-baseline mismatches, which is based on the consistence of local contour fragments between two matched regions, is presented. Experimental results show that the proposed approach can efficiently extract high-precision matches from low-precision initial SIFT matches and performs best, or close to best, in comparison with state-of-the-art methods.
  • Keywords
    feature extraction; image matching; transforms; SIFT matches; local contour fragments; wide-baseline image matching methods; wide-baseline mismatch;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2010.1128
  • Filename
    5483954
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1514739