DocumentCode :
1514796
Title :
Measuring complex permeability of ferromagnetic thin films using non-50 Ω shorted microstrip method
Author :
Wu, Yaowu ; Tang, Zhen ; Xu, Yan ; Zhang, Boming
Author_Institution :
Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China (UESTC), Chengdu, China
Volume :
46
Issue :
12
fYear :
2010
Firstpage :
848
Lastpage :
850
Abstract :
A non-50 Ω shorted microstrip method is proposed to measure the complex permeability of ferromagnetic thin film. The proposed method, using a higher characteristic impedance microstrip, achieves a more compact fixture structure and can be applied to a higher operation frequency. The experimental results show that, assuming the discontinuity effect between the coaxial-microstrip connector and the microstrip, the permeability measured using the non-50 Ω shorted microstrip method agrees excellently with that measured using the 50 Ω shorted microstrip method.
Keywords :
magnetic permeability measurement; magnetic thin films; microstrip components; coaxial-microstrip connector; complex permeability measurement; ferromagnetic thin films; higher characteristic impedance microstrip; nonshorted microstrip method; resistance 50 ohm;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2010.0464
Filename :
5483963
Link To Document :
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