Title :
Guest Editors´ Introduction: Yield Learning Processes and Methods
Author :
Gattiker, Anne ; Nigh, Phil
Author_Institution :
IBM,
Abstract :
The articles in this special section are devoted to the topic yield learning processes and methods.
Keywords :
Failure analysis; Fault diagnosis; Learning systems; Machine learning; Special issues and sections; Yield estimation;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2011.2180958
