Spectral linewidth in oxide-confined vertical-cavity surface-emitting lasers

Author

Debernardi, Pierluigi ; Fratta, Laura ; Bava, Gian Paolo

Author_Institution

Politecnico di Torino, Italy

Volume

37

Issue

8

fYear

2001

fDate

8/1/2001 12:00:00 AM

Firstpage

1084

Lastpage

1094

Abstract

We present a model to compute the linewidth in vertical-cavity surface-emitting lasers (VCSELs), by accounting for the 3-D structure of real devices. To this aim, we include the noise source in the field equations and treat both the noise and the structural characteristics by means of coupled-mode theory. In this way, we obtain an expression for the linewidth that is given as the standard relation, modified by two correction factors that account for spatial effects and modal dispersion of the resonator. In the numerical results, we study for oxide-confined VCSELs the transition from index to gain-guided regime, where the standard linewidth theory does not hold, and we give some guidelines for narrow-line emission devices

Keywords

coupled mode analysis; laser cavity resonators; laser noise; laser theory; quantum well lasers; spectral line breadth; surface emitting lasers; 3-D structure; VCSELs; correction factors; coupled-mode theory; field equations; gain-guided regime; index-guided regime; model; narrow-line emission devices; noise source; numerical results; oxide-confined VCSELs; oxide-confined vertical-cavity surface-emitting lasers; resonator modal dispersion; spatial effects; spectral linewidth; Laser modes; Laser noise; Laser theory; Optical surface waves; Semiconductor device noise; Semiconductor lasers; Spontaneous emission; Surface emitting lasers; Surface treatment; Vertical cavity surface emitting lasers;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.937398

Filename

937398