Title :
Model for Power SiC Vertical JFET With Unified Description of Linear and Saturation Operating Regimes
Author :
Chen, Zhiyang ; Grekov, Alexander E. ; Fu, Ruiyun ; Hudgins, Jerry L. ; Mantooth, H. Alan ; Sheridan, David C. ; Casady, Jeff ; Santi, Enrico
Author_Institution :
Univ. of South Carolina, Columbia, SC, USA
Abstract :
A novel SiC junction field-effect transistor (JFET) model that uses a unified description of linear and saturated conduction modes is proposed. Advantages of the proposed model are improved robustness and convergence, inclusion of field-dependent mobility effects, and more physical description of the current saturation phenomenon. The model is validated against a normally off JFET sample over a wide temperature range. Finite-element simulations are used to demonstrate the physics-based nature of the proposed model.
Keywords :
finite element analysis; junction gate field effect transistors; power field effect transistors; silicon compounds; SiC; field-dependent mobility effects; finite-element simulations; junction field-effect transistor model; linear conduction modes; physics-based nature; power vertical JFET; saturated conduction modes; Electric fields; Equations; JFETs; Logic gates; Mathematical model; Semiconductor process modeling; Silicon carbide; junction field-effect transistor (JFET) switches; power semiconductor devices; silicon carbide JFETs;
Journal_Title :
Industry Applications, IEEE Transactions on
DOI :
10.1109/TIA.2011.2154296