DocumentCode :
1515669
Title :
Wafer-Level Parylene Packaging With Integrated RF Electronics for Wireless Retinal Prostheses
Author :
Li, Wen ; Rodger, Damien C. ; Meng, Ellis ; Weiland, James D. ; Humayun, Mark S. ; Tai, Yu-Chong
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Volume :
19
Issue :
4
fYear :
2010
Firstpage :
735
Lastpage :
742
Abstract :
This paper presents an embedded chip integration technology that incorporates silicon housings and flexible Parylene-based microelectromechanical systems (MEMS) devices. Accelerated-lifetime soak testing is performed in saline at elevated temperatures to study the packaging performance of Parylene C thin films. Experimental results show that the silicon chip under test is well protected by Parylene, and the lifetime of Parylene-coated metal at body temperature (37°C) is more than 60 years, indicating that Parylene C is an excellent structural and packaging material for biomedical applications. To demonstrate the proposed packaging technology, a flexible MEMS radio-frequency (RF) coil has been integrated with an RF identification (RFID) circuit die. The coil has an inductance of 16 μH with two layers of metal completely encapsulated in Parylene C, which is microfabricated using a Parylene-metal-Parylene thin-film technology. The chip is a commercially available read-only RFID chip with a typical operating frequency of 125 kHz. The functionality of the embedded chip has been tested using an RFID reader module in both air and saline, demonstrating successful power and data transmission through the MEMS coil.
Keywords :
bioMEMS; biomedical materials; chip scale packaging; eye; prosthetics; radiofrequency identification; silicon; wafer level packaging; MEMS; RF electronics; RF identification; accelerated-lifetime soak testing; chip integration technology; frequency 125 kHz; microelectromechanical systems; parylene packaging; temperature 37 degC; wafer-level packaging; wireless retinal prostheses; Accelerated-lifetime soak testing (ALST); Parylene C; chip packaging; radio-frequency (RF) coil;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2010.2049985
Filename :
5484543
Link To Document :
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