Title :
Free space range measurements with Semtech Lora™ technology
Author :
Aref, Mohammadreza ; Sikora, Axel
Author_Institution :
Lab. Embedded Syst. & Commun. Electron., Offenburg Univ. of Appl. Sci., Offenburg, Germany
Abstract :
Although short range wireless communication explicitly targets local and very regional applications, range continues to be an extremely important issue. The range directly depends on the so called link budget, which can be increased by the choice of modulation and coding schemes. Especially, the recent transceiver generation comes with extensive and flexible support for Software Defined Radio (SDR). The SX127x family from Semtech Corp. is a member of this device class and promises significant benefits for range, robust performance, and battery lifetime compared to competing technologies. This contribution gives a short overview into the technologies to support Long Range (LoRa ™), describes the outdoor setup at the Laboratory Embedded Systems and Communication Electronics of Offenburg University of Applied Sciences, shows detailed measurement results and discusses the strengths and weaknesses of this technology.
Keywords :
digital signal processing chips; encoding; modulation; radio transceivers; software radio; Offenburg University of Applied Sciences; SDR; SX127x family; Semtech Corp; Semtech Long Range technology; Semtech Lora technology; battery lifetime; coding schemes; communication electronics; device class; free space range measurements; laboratory embedded systems; link budget; modulation schemes; short range wireless communication; software defined radio; transceiver generation; Fresnel reflection; Length measurement; Payloads; Receivers; Semiconductor device measurement; Signal to noise ratio; Wireless communication; Spread spectrum; packet error rate; software defined radio;
Conference_Titel :
Wireless Systems within the Conferences on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS-SWS), 2014 2nd International Symposium on
Conference_Location :
Offenburg
Print_ISBN :
978-1-4799-6721-6
DOI :
10.1109/IDAACS-SWS.2014.6954616