Author :
Troster, G. ; Scheffler, Marc
Author_Institution :
ETH Zurich
Keywords :
Application software; Electronics packaging; Energy consumption; Europe; Helium; Implants; Integrated circuit packaging; Optical interconnections; Performance loss; Pervasive computing;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2001.938304