Title :
100-Mbit/s single-chip Q-VLMS MLSE equalizer LSI for TDMA mobile radio communications
Author :
Shirato, Yushi ; Kobayashi, Kiyoshi ; Denno, Satoshi
Author_Institution :
NTT Network Innovation Labs., Kanagawa, Japan
fDate :
8/1/2001 12:00:00 AM
Abstract :
A single-chip 100-Mbit/s burst-operation two-tap maximum likelihood sequence estimation (MLSE) equalizer LSI for QPSK signals is introduced. It also supports two-branch diversity combining. Three new techniques are used to realize this fast equalizer LSI: the quantized variable-gain least mean squares (VLMS) algorithm, which has small processing delay with fast convergence characteristics; a simple complex-valued multiplication scheme based on inverting the sign and switching the in-phase and quadrature-phase components; and a parallel structure to minimize the processing delay of path memory. The chip, containing 75 kgates, is manufactured using the 0.45-μm-CMOS gate array process. The supply voltage is 3.3 V. This LSI offers higher processing speed than any other conventional equalizer chip for mobile radio communications
Keywords :
CMOS digital integrated circuits; adaptive equalisers; intersymbol interference; large scale integration; least mean squares methods; maximum likelihood sequence estimation; mobile radio; quadrature phase shift keying; time division multiple access; 100 Mbit/s; 3.3 V; CMOS gate array process; QPSK signals; TDMA mobile radio communication; burst-operation two-tap equalizer; complex-valued multiplication scheme; fast convergence characteristics; fast equalizer LSI; frequency selective fading; in-phase components; intersymbol interference; parallel structure; quadrature-phase components; quantized variable-gain LMS algorithm; single-chip Q-VLMS MLSE equalizer LSI; small processing delay; two-branch diversity combining; Convergence; Delay; Diversity reception; Equalizers; Large scale integration; Manufacturing processes; Maximum likelihood estimation; Quadrature phase shift keying; Time division multiple access; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
