DocumentCode
1516240
Title
Conference Reports
Volume
28
Issue
3
fYear
2011
Firstpage
82
Lastpage
83
Abstract
Conference Reports features the second IEEE International Workshop on Reliability Aware System Design and Test (RASDAT),which was held in conjunction with the 24th International Conference on VLSI Design.
Keywords
RASDAT; design and test;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2011.57
Filename
5766813
Link To Document