• DocumentCode
    151648
  • Title

    Finite alphabet iterative decoders robust to faulty hardware: Analysis and selection

  • Author

    Dupraz, Elsa ; Declercq, David ; Vasic, Bane ; Savin, Valentin

  • Author_Institution
    ETIS - ENSEA, Univ. Cergy-Pontoise, Cergy-Pontoise, France
  • fYear
    2014
  • fDate
    18-22 Aug. 2014
  • Firstpage
    107
  • Lastpage
    111
  • Abstract
    In this paper, we analyze Finite Alphabet Iterative Decoders (FAIDs) running on faulty hardware. Under symmetric error models at the message level, we derive the noisy Density Evolution equations, and introduce a new noisy threshold phenomenon (called functional threshold), which accurately characterizes the convergence behavior of LDPC code ensembles under noisy-FAID decoding. The proposed functional threshold is then used to identify FAIDs which are particularly robust to the transient hardware noise. Finite-length simulations are drawn to verify the validity of the asymptotical study.
  • Keywords
    iterative decoding; parity check codes; FAID analysis; faulty hardware; finite alphabet iterative decoders; functional threshold; noisy density evolution equations; noisy threshold phenomenon; symmetric error models; transient hardware noise; Decoding; Error probability; Hardware; Iterative decoding; Noise; Noise measurement; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Turbo Codes and Iterative Information Processing (ISTC), 2014 8th International Symposium on
  • Conference_Location
    Bremen
  • Type

    conf

  • DOI
    10.1109/ISTC.2014.6955095
  • Filename
    6955095