Title :
Finite alphabet iterative decoders robust to faulty hardware: Analysis and selection
Author :
Dupraz, Elsa ; Declercq, David ; Vasic, Bane ; Savin, Valentin
Author_Institution :
ETIS - ENSEA, Univ. Cergy-Pontoise, Cergy-Pontoise, France
Abstract :
In this paper, we analyze Finite Alphabet Iterative Decoders (FAIDs) running on faulty hardware. Under symmetric error models at the message level, we derive the noisy Density Evolution equations, and introduce a new noisy threshold phenomenon (called functional threshold), which accurately characterizes the convergence behavior of LDPC code ensembles under noisy-FAID decoding. The proposed functional threshold is then used to identify FAIDs which are particularly robust to the transient hardware noise. Finite-length simulations are drawn to verify the validity of the asymptotical study.
Keywords :
iterative decoding; parity check codes; FAID analysis; faulty hardware; finite alphabet iterative decoders; functional threshold; noisy density evolution equations; noisy threshold phenomenon; symmetric error models; transient hardware noise; Decoding; Error probability; Hardware; Iterative decoding; Noise; Noise measurement; Robustness;
Conference_Titel :
Turbo Codes and Iterative Information Processing (ISTC), 2014 8th International Symposium on
Conference_Location :
Bremen
DOI :
10.1109/ISTC.2014.6955095