• DocumentCode
    1516755
  • Title

    The Effect of the Imperfect Realization of the Artificial Mains Network Impedance on the Reproducibility of Conducted Emission Measurements

  • Author

    Carobbi, Carlo F M ; Stecher, Manfred

  • Author_Institution
    Dept. of Electron. & Telecommun., Univ. of Florence, Florence, Italy
  • Volume
    54
  • Issue
    5
  • fYear
    2012
  • Firstpage
    986
  • Lastpage
    997
  • Abstract
    Closed-form formulas are derived permitting us to evaluate the nonreproducibility of conducted emission measurements due to the imperfect realization of the artificial mains network impedance. Since this is the dominant contribution to the combined standard measurement instrumentation uncertainty, the availability of such formulas permits us to tailor the uncertainty value to the actual measurement capability of testing laboratories. Furthermore, analytical formulas provide guidance both to the technical committees involved in the standardization process, when they set tolerances on the complex impedance of coupling/decoupling networks, and to the manufacturers of instrumentation, since they have to optimize the design of the networks in order to comply with the standards specifications. The nonreproducibility error is quantified in terms of its expected value and standard uncertainty. A simple and reasonably accurate approximation of its probability density function is also obtained. A comparison with the material reported in the relevant international standards is offered in order to highlight the common and the innovative aspects of the results derived here.
  • Keywords
    computerised instrumentation; electric impedance measurement; measurement uncertainty; optimisation; probability; artificial main network impedance; complex impedance; conducted emission measurement; coupling-decoupling network; nonreproducibility error; optimization; probability density function; standard measurement instrumentation uncertainty; Electromagnetic compatibility; Impedance; Impedance measurement; Measurement uncertainty; Probabilistic logic; Standards; Uncertainty; Artificial mains network (AMN); conducted emission (CE); measurement reproducibility; measurement uncertainty;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2012.2196046
  • Filename
    6200320