Title :
Improved near-field scanning system for encircled flux measurement
Author :
He, Guangjun ; Breton, Marie ; Dallaire-Poirier, S. ; Bull, Geoff ; Schinn, G.W. ; St-Amant, Y. ; Morel, Jean-Michel ; Gambon, A.
Author_Institution :
EXFO Inc., Québec, QC, Canada
Abstract :
The authors propose an improved near-field scanning system for measuring the mode distribution exiting a multimode fibre (MMF), notably for evaluating conformity to the encircled flux (EF) standard of a measurement source used for MMF loss/attenuation characterisation. This system offers advantages over both charge coupled device (CCD)-based and traditional scanning approaches. EF measurements taken with this new system are in excellent agreement with CCD-based measurements.
Keywords :
optical fibre losses; optical fibre testing; optical variables measurement; charge coupled device; encircled flux measurement; mode distribution; multimode fibre; near-field scanning system; optical loss;
Journal_Title :
Optoelectronics, IET
DOI :
10.1049/iet-opt.2009.0096
