DocumentCode :
1517253
Title :
International Symposium on Semiconductor Manufacturing
Volume :
14
Issue :
3
fYear :
2001
fDate :
8/1/2001 12:00:00 AM
Abstract :
The individual sessions of the conference covered a wide variety of topics, including fab design, strategy and management, manufacturing control and execution, defect reduction and yield enhancement, ultra clean technology, process and metrology equipment, process and materials optimization, and environmental issues
Keywords :
semiconductor technology; environmental factors; fab management; semiconductor manufacturing; ultra-clean technology; Electronics industry; Manufacturing industries; Manufacturing processes; Meetings; Metallization; Optimized production technology; Semiconductor device manufacture; Semiconductor materials; Technological innovation; Technology management;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.939808
Filename :
939808
Link To Document :
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