• DocumentCode
    1517418
  • Title

    Ce Concentration Dependence of Optical and Scintillation Properties for Ce Doped {\\rm LiYF}_{4} Single Crystals

  • Author

    Yokota, Yuui ; Yanagida, Takayuki ; Abe, Naoto ; Kawaguchi, Noriaki ; Fukuda, Kentaro ; Nikl, Martin ; Yoshikawa, Akira

  • Author_Institution
    Inst. of Multidiscipl. Res. for Adv. Mater., Tohoku Univ., Miyagi, Japan
  • Volume
    57
  • Issue
    3
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1241
  • Lastpage
    1244
  • Abstract
    We have investigated effects of Ce concentration on optical and scintillation properties for Ce doped LiYF4 [Ce:LiYF4] single crystals. Li(Y1-x,Cex)F4 single crystals with more than 75 % transparency were grown by micro-pulling-down method in the range of 0 ≤ x ≤ 0.03 and the crystals with x = 0.05, 0.1 had milky parts originated from remained starting materials. Photoluminescence spectra of all Ce:LiYF4 crystals indicated two emission peaks from Ce3+ ion which was substituted for Y3+ ion site. Light yield and decay time of α-ray irradiation for Ce:LiYF4 crystals were largely affected by Ce concentration and the largest light yield was observed for the crystal with x = 0.02. In contrast, the decay time systematically became faster with an increase of Ce concentration.
  • Keywords
    alpha-particle effects; crystal growth from melt; doping profiles; lithium compounds; neutron detection; photoluminescence; scintillation; semiconductor counters; semiconductor doping; solid scintillation detectors; Ce concentration; Ce doped LiYF4 single crystals; LiYF4:Ce; alpha-ray irradiation; decay time; light yield; micropulling down method; optical properties; photoluminescence spectra; scintillation properties; Attenuation; Crystalline materials; Crystals; High speed optical techniques; Neutrons; Optical attenuators; Optical materials; Particle beam optics; Photoluminescence; Security; Cerium; crystal growth; fluorine compounds; neutron scintillator;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2040836
  • Filename
    5485071