• DocumentCode
    1517480
  • Title

    Relationship between and measurement of differential scattering coefficient (σ0) and bidirectional reflectance distribution function (BRDF)

  • Author

    Tomiyasu, Kiyo

  • Author_Institution
    General Electric Corp., Philadelphia, PA, USA
  • Volume
    26
  • Issue
    5
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    660
  • Lastpage
    665
  • Abstract
    The microwave and optical scattering formulations are reviewed, a relationship between them at the same wavelength is presented, and the measurement conditions for obtaining range-independent and equipment-independent values are discussed. It is shown that the physical mechanism of scattering of electromagnetic beams from a surface can be quantified by either a differential scattering coefficient (σ0) or a bidirectional reflectance distribution function (BRDF). For a diffuse surface, σ0=4π BRDF cos θi cos θr, where θi and θr are the incident and reflected angles, respectively, from the surface normal. The geometrical constraints inferred in the measurement of coherent electromagnetic wave scattering from relatively small objects are easily satisfied to obtain range- and equipment-independent values, but care in experimental design is required when dealing with large surfaces. More care is also required when dealing with surfaces entailing specular features in addition to diffuse features
  • Keywords
    atmospheric optics; microwave links; radar applications; remote sensing; remote sensing by laser beam; BRDF; atmosphere; bidirectional reflectance distribution function; differential scattering coefficient; electromagnetic beams; land surface; laser; light propagation; microwave; optical scattering formulations; optics; radar remote sensing; radiowave propagation; specular features; Beams; Bidirectional control; Distribution functions; Electromagnetic measurements; Electromagnetic scattering; Microwave devices; Microwave measurements; Optical scattering; Optical surface waves; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/36.7692
  • Filename
    7692