DocumentCode
1517480
Title
Relationship between and measurement of differential scattering coefficient (σ0) and bidirectional reflectance distribution function (BRDF)
Author
Tomiyasu, Kiyo
Author_Institution
General Electric Corp., Philadelphia, PA, USA
Volume
26
Issue
5
fYear
1988
fDate
9/1/1988 12:00:00 AM
Firstpage
660
Lastpage
665
Abstract
The microwave and optical scattering formulations are reviewed, a relationship between them at the same wavelength is presented, and the measurement conditions for obtaining range-independent and equipment-independent values are discussed. It is shown that the physical mechanism of scattering of electromagnetic beams from a surface can be quantified by either a differential scattering coefficient (σ0) or a bidirectional reflectance distribution function (BRDF). For a diffuse surface, σ0=4π BRDF cos θi cos θr, where θi and θr are the incident and reflected angles, respectively, from the surface normal. The geometrical constraints inferred in the measurement of coherent electromagnetic wave scattering from relatively small objects are easily satisfied to obtain range- and equipment-independent values, but care in experimental design is required when dealing with large surfaces. More care is also required when dealing with surfaces entailing specular features in addition to diffuse features
Keywords
atmospheric optics; microwave links; radar applications; remote sensing; remote sensing by laser beam; BRDF; atmosphere; bidirectional reflectance distribution function; differential scattering coefficient; electromagnetic beams; land surface; laser; light propagation; microwave; optical scattering formulations; optics; radar remote sensing; radiowave propagation; specular features; Beams; Bidirectional control; Distribution functions; Electromagnetic measurements; Electromagnetic scattering; Microwave devices; Microwave measurements; Optical scattering; Optical surface waves; Wavelength measurement;
fLanguage
English
Journal_Title
Geoscience and Remote Sensing, IEEE Transactions on
Publisher
ieee
ISSN
0196-2892
Type
jour
DOI
10.1109/36.7692
Filename
7692
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