DocumentCode :
1517527
Title :
Scintillation Properties of In Doped ZnO With Different In Concentrations
Author :
Yanagida, Takayuki ; Fujimoto, Yutaka ; Yoshikawa, Akira ; Yokota, Yuui ; Miyamoto, Miyuki ; Sekiwa, Hideyuki ; Kobayashi, Jun ; Tokutake, Taichi ; Kamada, Kei ; Maeo, Shuji
Author_Institution :
Inst. of Multidiscipl. Res. for Adv. Mater., Tohoku Univ., Sendai, Japan
Volume :
57
Issue :
3
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1325
Lastpage :
1328
Abstract :
Using the liquid phase epitaxy (LPE) method we prepared the high crystalline quality In ^{3+} doped ZnO thin film scintillators with different Indium concentration of 26, 53, and 141 ppm. We evaluated their optical properties and radiation response, because there are few reports of radiation response of In-doped ZnO scintillator. In order to imitate the scintillator application, we measured the alpha-ray excited luminescence spectra. The emission bands peaking around 375 and 500 nm were observed, and with an increment of In ^{3+} , the intensity of both bands decreases. In the measurement of light yield, we optically coupled the sample with PMT R7600 by a silicone grease, and excitation was provided by ^{241} Am 5.5 MeV \\alpha -rays. The samples showed of about 10% of the light yield of BGO scintillator which was used as a reference. Under the same excitation the scintillation decay was measured in all the samples as well.
Keywords :
Crystallization; Epitaxial growth; Indium; Materials science and technology; Optical films; Radiation detectors; Solid scintillation detectors; Stimulated emission; Transistors; Zinc oxide; Gamma-ray detectors; indium; radiation detectors; scintillation detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2009.2035120
Filename :
5485087
Link To Document :
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