Title :
Testing of telecommunications hardware [Guest Editorial]
Author :
Rajski, J. ; Tyszer, J.
fDate :
6/1/1999 12:00:00 AM
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Design for testability; Hardware; Integrated circuit technology; Integrated circuit testing; Microelectronics; System testing; Telecommunications;
Journal_Title :
Communications Magazine, IEEE
DOI :
10.1109/MCOM.1999.769275
