Title :
Mixed Field Dosimetry Using Semiconductor Dosimeters at an Extremely High Dose Area
Author :
Lee, Nam Ho ; Lee, Seung Min ; Youk, Geun Uck
Author_Institution :
Korea Atomic Energy Res. Inst., Daejeon, South Korea
fDate :
6/1/2010 12:00:00 AM
Abstract :
The goal of this research was to measure extremely high doses of ionizing and non-ionizing radiation separately near a commercial nuclear reactor. Specially designed p-MOSFETs were used for detecting ionizing radiation. Custom PIN diode dosimeters were developed in-house for measuring high dose of non-ionizing radiation. The two semiconductor dosimeters successfully measured ionizing and non-ionizing radiation separately in a mixed-field high-radiation environment. The neutron sensitivity of the developed dosimeter was 14.63 mV/cGy, or three times higher than that of the conventional ones. This paper describes the development, calibration, and application of the diode dosimeter.
Keywords :
MOSFET; calibration; dosimeters; dosimetry; p-i-n diodes; radiation monitoring; semiconductor counters; PIN diode dosimeters; calibration; commercial nuclear reactor; extremely high dose area; ionizing radiation; ionizing radiation detection; mixed field dosimetry; neutron sensitivity; nonionizing radiation; p-MOSFET; semiconductor dosimeters; Atomic measurements; Dosimetry; Inductors; Ionizing radiation; Lattices; MOSFETs; Neutrons; Radiation effects; Robots; Semiconductor diodes; Dosimetry; mixed-field; nuclear reactor; semiconductor;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2046749