DocumentCode :
1517758
Title :
Can Pr-Doped YAP Scintillator Perform Better?
Author :
Nikl, Martin ; Mares, Jiri A. ; Vedda, Anna ; Fasoli, Mauro ; Laguta, Valentin ; Mihokova, Eva ; Pejchal, Jan ; Zhuravleva, Mariya ; Yoshikawa, Akira ; Nejezchleb, Karel
Author_Institution :
Inst. of Phys. AS CR v. v. i., Prague, Czech Republic
Volume :
57
Issue :
3
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1168
Lastpage :
1174
Abstract :
A numerous set of Pr-doped YAP single crystals was prepared using Czochralski and micro-pulling down methods. Crystals codoped by bi-, tri- and tetravalent ions were prepared by the latter method as well. The scintillation performance of all the prepared materials was evaluated using radioluminescence, photoelectron yield and scintillation decay measurements at room temperature. The influence of shallow traps was studied by means of thermoluminescence in the 10-350 K temperature range. Though the intrinsic scintillation efficiency of Pr-doped YAP is higher than that of YAP:Ce, enhanced delayed radiative recombination processes are found to be responsible for lower-than-expected photoelectron yield of the former system. The possibilities of further optimization of Pr-doped YAP scintillator are discussed.
Keywords :
aluminium compounds; crystal growth from melt; doping; photoelectron spectra; praseodymium; solid scintillation detectors; thermoluminescence; yttrium compounds; Czochralski method; YAP scintillator; YAlO3:Pr; codoping; micropulling down method; photoelectron yield; radiative recombination; radioluminescence; scintillation decay measurement; scintillation performance; temperature 10 K to 350 K; thermoluminescence; Aluminum; Chromium; Crystalline materials; Crystals; Delay; Doping; Materials science and technology; Physics; Temperature distribution; Temperature measurement; Luminescence; Pr-doped YAP; photoelectron yield; scintillator; thermoluminescence;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2043116
Filename :
5485127
Link To Document :
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