DocumentCode :
1517767
Title :
Device Modeling of Superconductor Transition-Edge Sensors Based on the Two-Fluid Theory
Author :
Tian-Shun Wang ; Guang-Can Guo ; Qing-Feng Zhu ; Jun-Xian Wang ; Tie-Fu Li ; Jian-She Liu ; Wei Chen ; Xingxiang Zhou
Author_Institution :
Dept. of Opt. & Opt. Eng., Univ. of Sci. & Technol. of China, Hefei, China
Volume :
22
Issue :
4
fYear :
2012
Firstpage :
2100212
Lastpage :
2100212
Abstract :
In order to support the design and research of sophisticated large-scale transition-edge sensor (TES) circuits, we use basic SPICE elements to develop device models for TESs based on the superfluid-normal fluid theory. In contrast to previous studies, our device model is not limited to small-signal simulation, and it relies only on device parameters that have clear physical meaning and can be easily measured. We integrate the device models in design kits based on powerful electronic design automation tools such as CADENCE and OrCAD and use them for versatile simulations of TES circuits. Comparing our simulation results with published experimental data, we find good agreement which suggests that device models based on the two-fluid theory can be used to predict the behavior of TES circuits reliably. Hence, they are valuable for assisting the design of sophisticated TES circuits.
Keywords :
circuit simulation; electronic design automation; integrated circuit reliability; superfluidity; CADENCE; OrCAD; SPICE elements; TES circuit reliability; electronic design automation tools; large-scale transition-edge sensor circuits; small-signal simulation; superconductor transition-edge sensors; superfluid-normal fluid theory; two-fluid theory; Heating; Integrated circuit modeling; Resistance; SPICE; Temperature dependence; Temperature measurement; Voltage control; Device model; SPICE; superfluid–normal fluid; transition-edge sensor (TES);
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2012.2196041
Filename :
6200835
Link To Document :
بازگشت