DocumentCode
1517854
Title
Global modeling of microwave applications by combining the FDTD method and a general semiconductor device and circuit simulator
Author
Witzig, Andreas ; Schuster, Christian ; Regli, Peter ; Fichtner, Wolfgang
Author_Institution
Dept. of Electr. Eng., Swiss Federal Inst. of Technol., Zurich, Switzerland
Volume
47
Issue
6
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
919
Lastpage
928
Abstract
This paper presents the coupling of two commercially available simulation codes: DESSIS-ISE, a multidimensional semiconductor device and circuit simulator, and EMLAB-ISE, an electromagnetic-field solver based on the finite-difference time-domain (FDTD) method. Full-wave electromagnetics and nonlinear devices are simulated in a coupled self-consistent way using the lumped-element approach. The active region of the device is represented as a lumped element within the FDTD grid, while the packaging and waveguiding structures are modeled in their physical dimensions. For the nonlinear device, multidimensional semiconductor device simulation, as well as standard SPICE models, may be applied. Several examples show the capability of comprehensive analysis of microwave applications and the versatility in the simulation of the active elements. The coupling formalism is explained in detail, including time-step adjustment and biasing of active devices
Keywords
SPICE; circuit simulation; finite difference time-domain analysis; microwave circuits; semiconductor device models; DESSIS-ISE; EMLAB-ISE; FDTD method; circuit simulator; coupled self-consistent method; finite-difference time-domain method; full-wave electromagnetics; global modeling; lumped-element approach; multidimensional semiconductor device simulator; standard SPICE models; time-step adjustment; waveguiding structures; Circuit simulation; Coupling circuits; Electromagnetic coupling; Electromagnetic devices; Finite difference methods; Microwave devices; Multidimensional systems; Semiconductor device packaging; Semiconductor devices; Time domain analysis;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.769327
Filename
769327
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