DocumentCode
1517878
Title
Global modeling strategies for the analysis of high-frequency integrated circuits
Author
Ciampolini, Paolo ; Roselli, Luca ; Stopponi, Giovanni ; Sorrentiono, R.
Author_Institution
Dept. of Inf. Eng., Parma Univ., Italy
Volume
47
Issue
6
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
950
Lastpage
955
Abstract
In this paper, a simulator based on a global electromagnetic model is presented, suited for the analysis of HF integrated and hybrid electronic circuits. The model is based on the self-consistent solution of Maxwell´s equation and of semiconductor transport equations, exploiting a generalized finite-difference time-domain (FDTD) scheme. The tool is, therefore, capable of accounting, on a distributed basis, for actual interactions between wave propagation and charge transport, anti is capable of providing a physically based picture of traveling-wave semiconductor devices. The implementation is such that more conventional algorithms (e.g. lumped-element FDTD or plain FDTD) can be regarded as a subset of the global scheme itself. This makes it possible to intermix different physical models, featuring different degrees of physical accuracy and computational efficiency, within the same simulation environment. Main features of such an environment are described by means of the simulation of a simple 76-GHz distributed switch
Keywords
circuit simulation; finite difference time-domain analysis; integrated circuit modelling; microwave integrated circuits; 76 GHz; Maxwell equations; distributed switch; finite difference time domain method; global electromagnetic model; high-frequency integrated circuit; hybrid electronic circuit; semiconductor transport equation; simulation algorithm; traveling-wave semiconductor device; Analytical models; Circuit simulation; Computational modeling; Electromagnetic analysis; Electromagnetic modeling; Electronic circuits; Finite difference methods; Hafnium; Maxwell equations; Time domain analysis;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.769331
Filename
769331
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