DocumentCode
1518118
Title
Electroless Contact Study on CdTe Nuclear Detectors: New Results and Element Deposition
Author
Ayoub, M. ; Dierre, F. ; Thompson, R.L. ; Pym, A.T.G. ; Radley, I. ; Basu, A.
Author_Institution
Kromek, Sedgefield, County Durham, UK
Volume
59
Issue
4
fYear
2012
Firstpage
1497
Lastpage
1503
Abstract
Electroless deposited contacts are frequently used for II–VI semiconductor materials and particularly on CdTe/CdZnTe. This chemical deposition method creates a stronger chemical bond and few nested interfacial layers between the contact and the semiconductor when compared to physical deposition methods such as sputtering or evaporation. This method also forms a moderate quasi-ohmic contact which eliminates the spectral degradation problem caused by the polarization effect.
Keywords
Chemicals; Contacts; Detectors; Leakage current; Surface treatment; Tungsten; CdTe; RBS; electrical performance; electroless deposition; heterojunction; nuclear detectors; semiconductors; thin films;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2194510
Filename
6200899
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