• DocumentCode
    1518118
  • Title

    Electroless Contact Study on CdTe Nuclear Detectors: New Results and Element Deposition

  • Author

    Ayoub, M. ; Dierre, F. ; Thompson, R.L. ; Pym, A.T.G. ; Radley, I. ; Basu, A.

  • Author_Institution
    Kromek, Sedgefield, County Durham, UK
  • Volume
    59
  • Issue
    4
  • fYear
    2012
  • Firstpage
    1497
  • Lastpage
    1503
  • Abstract
    Electroless deposited contacts are frequently used for II–VI semiconductor materials and particularly on CdTe/CdZnTe. This chemical deposition method creates a stronger chemical bond and few nested interfacial layers between the contact and the semiconductor when compared to physical deposition methods such as sputtering or evaporation. This method also forms a moderate quasi-ohmic contact which eliminates the spectral degradation problem caused by the polarization effect.
  • Keywords
    Chemicals; Contacts; Detectors; Leakage current; Surface treatment; Tungsten; CdTe; RBS; electrical performance; electroless deposition; heterojunction; nuclear detectors; semiconductors; thin films;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2194510
  • Filename
    6200899