DocumentCode :
1518202
Title :
An Effective Formulation of Coupled Electromagnetic-TCAD Simulation for Extremely High Frequency Onward
Author :
Chen, Quan ; Schoenmaker, Wim ; Meuris, Peter ; Wong, Ngai
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of California, San Diego, CA, USA
Volume :
30
Issue :
6
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
866
Lastpage :
876
Abstract :
This paper presents an effective formulation tailored for electromagnetic-technology computer-aided design coupled simulations for extremely-high-frequency ranges and beyond (>;50 GHz). A transformation of variables is exploited from the starting A-V formulation to the E-V formulation, combined with adopting the gauge condition as the equation for scalar potential. The transformation significantly reduces the cross-coupling between electric and magnetic systems at high frequencies, providing therefore much better convergence for iterative solution. The validation of such transformations is ensured through a careful analysis of redundancy in the coupled system and material properties. Employment of the advanced matrix permutation technique further alleviates the extra computational cost introduced by the variable transformation. Numerical experiments confirm the accuracy and efficiency of the proposed E-V formulation.
Keywords :
iterative methods; technology CAD (electronics); A-V formulation; E-V formulation; advanced matrix permutation technique; coupled electromagnetic-TCAD simulation; electromagnetic-technology computer-aided design coupled simulations; extremely-high-frequency ranges; gauge condition; iterative solution; material properties; scalar potential; variable transformation; Computational modeling; Equations; Integrated circuit modeling; Magnetic separation; Materials; Mathematical model; Metals; A-V solver; E-V solver; coupled simulation; electromagnetic; high frequency; semiconductor;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2010.2103270
Filename :
5768127
Link To Document :
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