Title :
A statistical theory of digital circuit testability
Author :
Seth, Sharad C. ; Agrawal, Vishwani D. ; Farhat, Hassan
Author_Institution :
Dept. of Comput. Sci. & Eng., Nebraska Univ., Lincoln, NE, USA
fDate :
4/1/1990 12:00:00 AM
Abstract :
A relation between the average fault coverage and circuit testability is developed. The statistical formulation allows computation of coverage for deterministic and random vectors. The following applications of this analysis are discussed: determination of circuit testability from fault simulation, coverage prediction from testability analysis, prediction of test length, and test generation by fault sampling
Keywords :
digital circuits; fault location; statistical analysis; average fault coverage; computation of coverage; coverage prediction; deterministic vectors; digital circuit testability; fault sampling; fault simulation; random vectors; statistical theory; test generation; Analytical models; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Digital circuits; Electrical fault detection; Fault detection; Sampling methods;
Journal_Title :
Computers, IEEE Transactions on
