Title :
A “cold” discharge mechanism for low-noise fast charge amplifiers
Author :
Pullia, Alberto ; Bassini, Roberto ; Boiano, Ciro ; Brambilla, Sergio
Author_Institution :
Politecnico di Milano, Italy
fDate :
6/1/2001 12:00:00 AM
Abstract :
We present a new discharge mechanism for low-noise fast preamplifiers for γ-ray spectroscopy. Such circuital solution has been conceived in the framework of the INFN Mars experiment, which imposes stringent requirements for both the signal-to-noise ratio and the rise time of the front-end preamplifiers. Basically, a noninverting low-gain (G) stage is interposed between the output of a conventional charge amplifier and the high-value feedback resistor. It can be easily found that this adds no noise but the discharge time constant is reduced by a factor G, because the voltage drop across the resistor is G times as high, and such is the discharge current. A similar effect could also be obtained in the standard charge amplifier by diminishing the feedback resistor by a factor G. But this would yield an increase of a factor G of its thermal current noise. In this sense our equivalent discharge resistor is “cold”, because it carries a current noise G times as low. This permits us to use a relatively large feedback capacitance which inherently yields a fast risetime. A rise time of 15 ns and an overall electronic noise of 1.03 keV FWNM at 3 μs shaping time have been obtained, with an input capacitance of 33 pF, and 1.5 pF feedback capacitor, 150 μs discharge time constant
Keywords :
gamma-ray spectrometers; nuclear electronics; preamplifiers; cold discharge mechanism; discharge time constant; feedback resistor; front-end preamplifiers; gamma-ray spectroscopy; high-value feedback resistor; low-noise fast charge amplifiers; noninverting low-gain stage; rise time; signal-to-noise ratio; thermal current noise; voltage drop; Capacitance; Circuits; Mars; Noise reduction; Noise shaping; Output feedback; Preamplifiers; Resistors; Signal to noise ratio; Spectroscopy;
Journal_Title :
Nuclear Science, IEEE Transactions on